Product

Shack-Hartmann Wavefront Sensor SHSLab

    The Hartmann detection technique originated in 1904, when Johannes Hartmann published a technique for measuring an objective lens using a metal mask with holes. In 1971, Roland Shack used a microlens array instead of holes, improving the light efficiency of the technique so that it could be applied to astronomical optics. This principle is therefore called the Shack-Hartmann wavefront detection technique.


    SHSLab uses this geometric optical Shack-Hartmann principle to measure wavefronts. The microlens array converts the local tilt of the light beam into a series of focus points on the camera. Through numerical integration, the deviation of the light point from the reference point can be calculated, and finally the relationship between the wavefront and the deviation of these light points is obtained. In principle, this technique allows the use of a single-frame measurement image to achieve wavefront measurement, so it is very fast and not affected by noise such as environmental vibration.

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SHSWorks software has powerful analytical capabilities. Its unique wavefront reconstruction algorithm enables SHSLab to measure wavefronts with large linear dynamic range and small local curvature, and to analyze a variety of optical parameters such as Zernike coefficients, PSF/MTF, laser parameters and diopter.

Through excellent hardware (SHSCam) and software (SHSWorks), SHSLab provides superior accuracy, dynamic range and flexibility.

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  • General Properties

    For optical measurements:

    - M2 radius of curvature

    - Wavefront aberration, PSF, MTF

    - Zernike coefficients

    Technical features:

    - Large dynamic measurement range

    - Wavefront tilt or defocus can be measured >1000 wave PV, e.g. wavefront tilt angle can exceed +/- 10 deg,

    - Wavefront distortion can be measured >1000 wave PV, e.g. local wavefront curvature >+/- 10mm

    - High measurement accuracy

    - Direct measurement accuracy: < 6nm rms (without reference wavefront subtraction)

  • Specifications

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    SHSCam – SWIR (980 - 1700 nm)

  • Optional Accessories

    - Telescope system

    - Reference sphere

    - Objective lens

    - Light source

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Technical article

  • Tel
    010-53391927
  • E-mail
    sales@lightedgetek.com
  • Add
    3155, 3rd Floor, Building 8, Weibo Haoyuan, No.1 Weigongcun Street, Haidian District, Beijing
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