With an unprecedented 0.06 nm spectral resolution, the PHOTON RT 0420 Ultra provides unparalleled flexibility for characterizing the performance of cutting-edge filters. Its advanced capabilities enable broadband measurements down to OD8 and the ability to characterize spectral steepness as small as 0.02%.
Designed to meet the stringent requirements of ultra-thin films, with a wavelength range of 340nm to 2000nm, it is suitable for optical thin films in a variety of advanced applications, including LiDAR, fluorescence microscopy, laser safety, telecommunications, space exploration, defense and security.
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Main Features
- Characterization of high optical density films
The extremely low level of stray light (only 1ppm), combined with the strong signal, enables the default measurement capability of optical density values up to OD8. The figure below shows the high OD broadband measurement results with a bandpass filter.
- Measurement of ultra-narrow bandpass filters
The PHOTON RT 0420 Ultra spectrophotometer not only successfully meets current metrological challenges, but also inspires thin film experts to design and produce complex thin film types with extremely small bandwidths. The following example shows the measurement of ultra-narrow bandpass filters optimized for the visible and near-infrared range.
- High spectral resolution
The PHOTON RT 0420 Ultra spectrophotometer uses a carefully designed additional Czerny-Turner double monochromator to provide an ultra-high spectral resolution of 0.06 nm.
The example below shows the ability of the monochromator to distinguish two closely spaced wavelengths in the double spectrum of a mercury lamp. The high spectral resolution of the spectrophotometer enables the measurement of ultra-narrow bandpass filters with steep slopes and small bandwidths.
