PHOTON RT 7512 LWIR Spectrophotometers
This model can perform transmission and reflection measurements of flat thin film components in the LWIR band at normal and variable incidence angles, and can automatically measure with polarized light at variable incidence angles up to 60 degrees. These tests are supported by built-in functions that accurately compensate for beam deviation at high angles and ensure that S- and P-polarization measurement results are obtained within minutes. The maximum sample thickness can be up to 40mm.
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Features and Applications
•LWIR transmission and reflection measurements with variable incidence angles
•High-precision measurements at zero and variable incidence angles
•Built-in high-contrast polarizer
•Extremely low noise measurements
•Fully automatic operation
